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ARM Stamp IO Test Program

Posted: Fri May 01, 2020 3:34 am
by mikechris
The attached program will quickly test the IO lines on the ARM Stamp.

To use the program, follow the prompts to select a full connector test, a single line test, a serial
SOUT/SIN test, an AD test, or options to see/change the values of the IO Configuration Registers.
The full connector tests generate a different signal on each of pins 1-20 on either J1 or J4.
Pin 1 will output about a 1 Hz squarewave, while pin 20 will output about a 20 Hz squarewave.
Just probe from Pin 1 to Pin 20 and watch the frequencies increase.
The single line test generates a 1 KHz tone, or a 1 KHz burst + blink, for 5 seconds.
The serial SOUT test outputs either a single character or a line of text with [CR][LF].
The serial SIN test reads in any available characters for 10 seconds.
The AD test reads the voltage present on the 8 AD lines (if lines are open, voltages are random).

Laptop, USB-cable, board, and scope or multi-meter with frequency counter.

Doc Issue:
While developing the test program an issue with the documentation was found.
As of the ARMbasic.chm version downloaded on 4/18/20, the 'LPC11U37 Details' page shows:
Pin J1-1, SOUT, IO(18), SP16
Pin J1-2, SIN, IO(19), SP17
The IO#'s are not consistent with the schematic or the LPC11U37 user's manual.
SOUT connects to a TXD output of the LPC11U37, IO(19) (port PIO0_19 as per Table 95).
SIN connects to an RXD input of the LPC11U37, IO(18) (port PIO0_18 as per Table 94).
The IO#'s for these two pins are swapped in ARMbasic.chm.
The SP#'s could be swapped or remain the same if STAMP_PINS.bas was changed.

Re: ARM Stamp IO Test Program

Posted: Sat May 02, 2020 2:04 am
by basicchip
Thank you for that, I have a similar program, but I never tested those 2 pins that I usually use for a serial port.